Scanning Electron Microscope

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Scanning Electron Microscope

We are the leading manufacturer and supplier of Scanning Electron Microscope. Now accepting bulk orders for government tenders in every major country around the globe.

Scanning Electron Microscope

Description:

Scanning Electron

Characterization of surfaces of materials: – Easy Probe, a compact scanning electron microscope (SEM) fully integrated with a selected energy dispersive X-ray microanalyser (EDX).

Technical Specifications:

Electron Gun: Tungsten heated cathode
Magnification: 3x to 1,000,000x (for 5’’ image width in Continual Wide Field/Resolution)
Maximum Field of View: 24 mm at WD 30 mm
Accelerating Voltage: 200 V to 30 kV
Probe Current: 1 pA to 2 µA
Scanning Speed: From 20 ns to 10 ms per pixel adjustable in steps or continuously

Scanning Features:

Point & Line Scan, Focus Window – shape, size and position continuously adjustable, Dynamic Focus – in plane or folded plane tilted up to ±70
Deg, Image rotation, Image shift, Tilt compensation, 3D Beam –defined tilting scanning axis around XY axis, Live Stereoscopic Imaging, Other scanning shapes available through the Draw Beam software

Image File format: